Electrical Test
Component testing:
If it is not functioning properly, the tiniest defective electronic component can affect the overall performance. Electrical testing, including verification testing and reliability testing, performed by a reputable electrical testing laboratory helps ensure that its components perform to specified electrical standards.
Compaq Electronics Asia Limited Provides electronic component testing, from functional to parametric, covering a wide range of COTS and mil-spec equipment including analog, power, passive, discrete, digital, mixed signal, logic, memory, high frequency and microprocessors.
Compaq Trained technicians and test engineers utilize advanced test equipment and customized test procedures to provide the most reliable tests in the industry. Every product we sell can be functionally and performance tested according to each customer's requirements, including full read log pass/fail data.
Compaq Execute the following services on discrete and non-discrete devices, including digital, mixed-signal, linear, memory, and passive devices:
Functional Testing (AC/DC)
Parametric Testing(AC/DC)
Electrical Curve Trace
Burn-In Testing
Failure Analysis
Group A& B Testing at Temperature
Pin Dependency Test:
Compaq Electronics Asia Limited the most cost-effective way to determine the probability of device health - compare a pin's signature measurements to all other pins to find consistent I/V characteristics. This test detects serious defects caused by improper handling or storage, such as opens, shorts, excessive leakage, ESD damage, etc.
Memory Test:
Compaq Electronics Asia Limited Provides various memory tests for products such as SRAM, EPROM, EEPROM, Flash, DRAM, SDRAM (DDR - DDR4), Hard Disk Drives (HDD), and Solid State Drives (SSD). PASS/FAIL memory tests are the most common and cost-effective; other tests include data insertion, configuration, write, read, erase, blank check, speed verification, voltage hold, and more.
Function Test:
According to customer's requirements mouser-ii can help customers to provide functional tests including DC and AC parameters. DC test parameters are usually measured in volts, amperes or ohms. DC testing ensures proper device operation - acceptable power consumption, basic functionality, validating datasheet parameters, etc.
It provides a reasonable cost/benefit trade-off when at least one datasheet parameter needs to be measured to verify functionality. AC test parameters are usually specified in time or frequency (nS, MHz, etc.). AC tests use periodic signals or clock test vectors to measure device speed/performance.
Compaq Electronics Asia Limited
Tel.: +852 9051 2529
Email: info@compaqelectronics.com
Add.: Room 504, Unit 2, Building 8, Huilongyuan, Minzhi Street, Longhua New District, Shenzhen
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